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SAWW Technologies6

device will need to simulate voltage spikes with durations ranging from nano- to millisecond durations, power surges of a magnitude comparable to that expected from prevalent high-voltage systems, and brownouts simulating the result of an overloaded power grid. This is the aim of our project. We want to design and fabricate such a test device.

This test device will add manufacturers to design appliances able to withstand the adverse power conditions and effects mentioned previously.

ECE 45125/1/2002

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