Chapter 5 – Worst-Case Jamming in SESS
SESS has been shown to achieve same performance as DSSS in AWGN and Rayleigh
fading channels. This chapter sets out to show through mathematical analysis and simulation
that SESS remains the same as DSSS in worst-case jamming.
As stated in Chapter 3.3 in Equation (8), the probability for error in a SESS system can
be expressed as: |
. Where refers to the number of errors in the
receiver code, and N is the chip length. In order to find the worst case jamming, this probability
for error must be used, in a similar fashion to DSSS, to the PNJ model. Equation 8 shows the
probability of error of SESS in the pulse noise jamming model.
| = 1 −
In the DSSS model, the assumption was made that the probability of error is dominated
by the jamming. By making the same assumptions in the SESS model, the (1 – ρ) Q-function