31

# Chapter 5 – Worst-Case Jamming in SESS

# 5.1 Introduction

SESS has been shown to achieve same performance as DSSS in AWGN and Rayleigh

fading channels. This chapter sets out to show through mathematical analysis and simulation

that SESS remains the same as DSSS in worst-case jamming.

5.2 Analysis

As stated in Chapter 3.3 in Equation (8), the probability for error in a SESS system can

be expressed as: _{| }

=

1−

2

2_{ }^{}

. Where refers to the number of errors in the

# receiver code, and N is the chip length. In order to find the worst case jamming, this probability

for error must be used, in a similar fashion to DSSS, to the PNJ model. Equation 8 shows the

probability of error of SESS in the pulse noise jamming model.

(13)

_{ }_{| }_{ }= 1 −

1−

2

2

+

1−

2

2

_{ }+ /

# In the DSSS model, the assumption was made that the probability of error is dominated

by the jamming. By making the same assumptions in the SESS model, the (1 – ρ) Q-function