Plenary session: Control and diagnostic systems
P.Forck, A.Peters (Gesellschaft fuer Schwerionenforschung GSI, Darmstadt, Germany) Innovative Beam Diagnostics for the challenging FAIR Project
The planned FAIR facility consists of two heavy ion synchrotrons and four large storage rings. The super-conducting synchrotrons are build for high current operation and secondary ion pro- duction. A large variety of low current secondary beams is stored and cooled in the four storage rings. A complex operation scheme with multiple use of transport lines is foreseen. This de- mands an exceptional high dynamic range for the beam instrumentation. Due to the enormous beam power, non-destructive methods are mandatory for high currents. For the low current sec- ondary beams, non-destructive diagnostics are preferred due to the low repetition rate. Precise measurements of all beam parameters and automatic steering or feedback capabilities are re- quired due to the necessary exploitation of the full ring acceptances. Moreover, online beam- corrections with short response times are mandatory for the fast ramping super-conducting mag- nets. Due to the ultra-high vacuum condition and the demanding measurement accuracy, novel technical solution are foreseen. An overview of the challenges and projected innovative solutions for various diagnostic installations will be given
Dr. Peter Forck: firstname.lastname@example.org
P.V.Logachev, D.A.Malutin, A.A.Starostenko (Budker Institute of Nuclear Physics, Novosi- birsk, Russia)
Low energy electron beam as a nondestructive diagnostic tool for high power beams.
The report is devoted to possible applications of low energy electron beam in diagnostics of in- tense beams. Experimental results of electron beam probe application in BINP are presented.
Dr. Pavel Vladimirovich Logachev: email@example.com
A.S.Gogolev, A.P.Potylitsyn, A.M.Taratin (Tomsk Polytechnic University, Tomsk, Russia) Method of Monitoring Crystal Deflectors
The accelerated beams extraction is one of the important problems of modern facilities, such as J-PARC or Tevatron. One of an efficient approach is the beam extraction with using bent crystal deflectors. The on-line control of the quality of crystal structure of deflector becomes necessary, when crystal deflector is used to extraction of intense proton or ion beams. For example, inten- sity of proton beam at accelerator J-PARC is ~ 3*1014 per spill. Investigation the possible radia- tion damage of usually used silicon deflectors is the open question for such beams. In this work, the monitoring of crystal deflectors quality based on registration of parametric x-ray radiation (PXR) is proposed. Proposed method gives a possibility to control a uniformity of deflector bending by measuring a PRX line width and allows to estimate a damage of deflector crystal structure under intense beam.
Alex Sergeevich Gogolev: firstname.lastname@example.org