G.Naumenko, A.Potylitsyn, L.Sukhikh (Nuclear Physics Institite, Tomsk, Russia)
High energy micron electron beam non-invasive diagnostics based on diffrac- tion radiation
The requirement for the accelerator installations of the next generations such as linear collider, where a small beam size at the interaction point is required to achieve a reasonable luminosity, stimulated new techniques development for a non-invasive measuring an electron beam size as small as 10 mm. The development of the non-invasive bunch size diagnostics based on the opti- cal diffraction radiation (ODR) is now in progress in frame of TPU-KEK-SLAC collaboration. The experimental test of a transverse beam size measurement was performed successful on the KEK-ATF extracted electron beam using the optical diffraction radiation from a flat conductive target with a slit. However many difficulties emerge if we going from the one GeV electron en- ergy to the several tenth GeV electron beams. The extremely high Lorenz-factor value gives rise to the some problems, such as a catastrophic decreasing of the method sensitivity to the beam size, extremely pre-wave zone effect even in the optical range and so on. We discuss here the origins of these difficulties and suggest the ways of these problem solutions. To provide the nec- essary method sensitivity to the ~5mm beam size we suggested to use the ODR from a target, consisting on two crossed conductive semi-planes. In this geometry ODR splits into two beams with phase difference depending on an electron position. If we bring together these beams, the interference picture became depending on the transverse beam size. However in contrast to the flat slit target technique this method sensitivity does not depend on a Lorenz-factor and may be used for high-energy electrons. Also the same technique may be used as a non-invasive beam size monitor by choosing of target parameters. This method was developed and successful tested on the extracted KEK-ATF electron beam. This test showed the possibility of a single bunch mi- cron beam size measurement. All of the preceding allows us to hope to create a tools for the non- invasive beam diagnostics of electron beam with Lorenz-factor higher than 60000.
Dr. Gennady Andreyevich Naumenko: email@example.com
V.Kozak (Budker Institute of Nuclear Physics, Novosibirsk, Russia) Embedded device set for control systems. Implementation and applications.
Creating new installation and upgrading existing facilities require a great amount of control de- vices. There was designed a unified device set for new control systems. All devices implemented as embedded controllers for incorporating into controlled equipment like power supplies, RF- station and so on. First applications show a lot of advantages embedded controllers over classical modular devices. Now these devices are widely used in control systems both in BINP and in other scientific institutions. Here are presented the developed device set, described implementa- tion and discussed typical applications.
Dr. Victor Kozak: firstname.lastname@example.org